Nan Ya Technology Corporation

Wen-Chang Cheng

Chuan-Jen Chang

A circuit test system including a circuit test apparatus and a circuit to be tested is provided. The circuit test apparatus provides a first clock signal. The circuit to be tested includes a plurality of input/output pads and at least one clock pad. At least two input/output pads of the input/output pads are connected to each other to form a test loop during a test mode. The clock pad receives the first clock signal. The circuit to be tested multiplies a frequency of the first clock signal to generate a second clock signal, and the test loop of the circuit to be tested is tested based on the second clock signal during the test mode. The frequency of the second clock signal is higher than that of the first clock signal. Furthermore, a circuit test method of the foregoing circuit test system is also provided.

Circuit test system electric element memory control chip under different test modes

A memory test system and a memory test method are provided. The memory test system includes a control unit, a data reading channel, a data writing channel and a test channel. The control unit generates and outputs a first read and a first write command. The data reading channel and the data writing channel coupled to the memory unit, and the control unit respectively reads data from the memory unit at a first time and writes the data back to the memory unit at a second time according to the first read command and the first write command. The test channel receives the data from the data reading channel through an input end and outputs the data back to the data writing channel through an output end after a time delay. The time delay is substantially equal to a time interval between the first time and the second time.

Memory test system and memory test method

A phase-locked loop (PLL) for clock delay adjustment and a method thereof are disclosed. The method includes the following steps. A reference clock signal and a clock signal are generated. The reference clock signal is fed through an N-divider to generate an output clock signal having a frequency 1/N of the reference clock signal. In a phase frequency detector, a control signal is generated in accordance with a phase difference and a frequency difference between the output clock signal and a feedback signal generated by a voltage controlled oscillator coupled to the phase frequency detector. The control signal is then fed through a charge pump and a loop filter to generate a voltage control signal according to the control signal. Moreover, in an adjustable delay element, a blended delay signal is generated according to a clock signal and the voltage control signal.

Phase-locked loop and method for clock delay adjustment

The invention provides a delay line circuit. The delay line circuit includes a delay line section and a feedback selection section. The delay line section receives an input clock signal and a feedback clock signal and delays one of the input clock signal and the feedback clock signal to generate an output clock signal, wherein the delay line section includes a plurality of delay units coupled in series. The feedback selection section is coupled to the delay line section and feedbacks the output clock signal to one of the delay units to serve as the feedback clock signal based on a selection signal. Wherein, one of the input clock signal and the feedback clock signal is delayed by a specific number of the delay units based on the selection signal to changes the frequency of the output clock signal.

Delay line circuit, delay locked loop and tester system including the same

A sensing amplifier consists of a sensing circuit, a boosting circuit, at least one bit-line isolating circuit, and at least a P-sensing enhancement circuit. The sensing circuit is disposed between a sensing line and a complementary sensing line. The boosting circuit boosts the sensing line and the complementary sensing line during a boosting stage. The bit-line isolating circuit is coupled to the sensing circuit for controlling whether to isolate a bit line/complementary bit line from the sensing line/complementary sensing line. The P-sensing enhancement circuit is coupled to the sensing line, the complementary sensing line, and a reference voltage. When the bit-line isolating circuit isolates the bit line from the sensing line and isolates the complementary bit line from the complementary sensing line, a voltage level of the bit line or the complementary bit line is pulled up to the reference voltage by the P-sensing enhancement circuit during an enhancement stage.

Sensing amplifier applied to at least a memory cell, memory device, and enhancement method for boosting the sensing amplifier thereof

A signal receiver includes a first input terminal, a second input terminal, a first transistor, a second transistor and a variable load. The first and the second transistors each include a gate electrode, a first electrode and a second electrode. The gate electrode of the first transistor is coupled to the first input signal terminal, the gate electrode of the second transistor is coupled to the second input signal terminal, and the variable load is coupled to the first electrode of the first transistor, where a resistance of the first variable load is adjusted to make a DC level at an output node of the signal receiver keep a constant value.

Signal receiver and voltage compensation method

A signal adjusting system includes: a signal generating apparatus for transmitting a first driving signal and a second driving signal, a plurality of signal transmitting paths coupled to the signal generating apparatus, and a controlling apparatus coupled to the plurality of signal transmitting paths for receiving a first transmitted signal corresponding to the first driving signal and a second transmitted signal corresponding to the second driving signal, and detecting a phase difference between the first transmitted signal and the second transmitted signal to generate a detected result for the signal generating apparatus, wherein the signal generating apparatus adjusts a first driving ability of the first driving signal and a second driving ability of the second driving signal according to the detected result.

Signal adjusting system and signal adjusting method

A charge pump includes a first transistor, a second transistor, a first, a second and a third selectors. The first transistor includes a gate electrode, a first electrode, and a second electrode which serves as an output port of the charge pump. The second transistor includes a gate electrode, a first electrode and a second electrode, where the gate electrode of the first transistor is coupled to the gate electrode of the second transistor, and the gate electrode of the second transistor is coupled to the second electrode of the second transistor. The first selector is utilized for selectively connecting the first transistor to a first supply voltage. The second selector is utilized for selectively connecting the first transistor to a second supply voltage. The third selector is utilized for selectively connecting the second transistor to the second supply voltage.

Charge pump and charging/discharging method capable of reducing leakage current

A signal adjusting system includes: a signal generating device for generating a plurality of output signals according to a plurality of pre-output signals, a plurality of signal transmitting paths being coupled to the signal generating device for transmitting the plurality of output signals; and a controlling device coupled to the plurality of signal transmitting paths for receiving a first transmitted signal corresponding to a first output signal and a second transmitted signal corresponding to a second output signal, and detecting a phase different between the first transmitted signal and the second transmitted signal to generate a detected result to the signal generating device, wherein the signal generating device adjusts the phase difference between the first output signal and the second output signal according to the detected result.

A signal receiver includes a first-stage circuit, a second-stage circuit, a current compensation circuit, and a biasing circuit. A first input end of the first-stage circuit receives a reference voltage, and a second end of the first-stage circuit receives an input signal. A first input end and a second input end of the second-stage circuit are respectively coupled to a first output end and a second output end of the first-stage circuit. The current compensation circuit is coupled to the first input end of the second-stage circuit for dynamically providing a compensation current to the first input end of the second-stage circuit in response to a biasing voltage, so as to stabilize its voltage level. The biasing circuit biases the first-stage circuit and the current compensation circuit and sets the biasing voltage of the current compensation circuit in response to the reference voltage.

Signal receiver and voltage compensation method thereof

A phase detection module includes a phase detection unit, a plurality of comparators and a decision unit. The phase detection unit is utilized for comparing a first input signal and a second signal to generate a phase detection result. The plurality of comparators is utilized for comparing the phase detection result with a plurality of predetermined voltages to generate a plurality of comparing results, respectively. The decision unit is utilized for deciding a phase relationship between the first and second input signals according to the plurality of comparing results.

Phase detection module and phase detection method

A clock receiver is provided. A receiving unit receives a pair of complementary clocks and generates a first clock, and a calibration unit detects whether a cross point of the complementary clocks has shifted, generates a detected result and accordingly adjusts toggling of the first clock.

Clock receivers

A phase detecting module includes a phase detecting unit, a comparator and a counter. The phase detecting unit is arranged to compare a first input signal and a second input signal to generate a phase detecting result. The comparator is arranged to compare the phase detecting result and a predetermined voltage to generate a comparing result. The counter is arranged to count one of the first input signal and the second input signal to generate a counting value. The phase detecting result and the counting value are reset if the counting value reaches a predetermined value, and the comparing result is outputted to a target device from the comparator if the counting value reaches a predetermined value.

Phase detecting module and related phase detecting method

Semiconductor circuit capable of selecting a corresponding adjusting parameter to adjust the received signal according to different voltages and frequencies. A voltage detector detects a voltage level of an external power voltage to generate a voltage detection signal, a frequency detector detects frequency of a main clock to generate a frequency detection signal, and a signal adjustment unit receives a first signal and selects one of a plurality of different adjusting parameters to adjust the first signal according to the voltage detection signal and the frequency detection signal.

Semiconductor circuits

A delay circuit respectively delays rising and falling edges of an input signal. The delay circuit comprises first and second delay lines, a control circuit, and first and second logic circuits. The first delay line delays the first input signal the first delay time to output the first delay output signal. The second delay line delays the first input signal the second delay time to output the second delay output signal. The control circuit outputs the control signal according to the first input signal. The first logic circuit receives the first delay output signal and outputs the first output signal according to the control signal and the first input signal. The second logic circuit receives the second delay output signal and outputs the second output signal according to the control signal and the first input signal. The first and second delay times are different.

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Taoyuan, Taiwan

Wen-Chang Cheng