Wen-Bin Jian

Title: Wen-Bin Jian: Innovator in Graphene Technology

Introduction

Wen-Bin Jian is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of graphene technology, holding a total of 2 patents. His work focuses on innovative methods for screening and separating graphene, as well as advancements in electron microscopy.

Latest Patents

Wen-Bin Jian's latest patents include a "Graphene Screening and Separation Method and Device." This invention outlines a method that utilizes a pair of electrodes and an energy barrier layer to effectively screen and separate graphene sheets. The process involves measuring tunneling current as a bias voltage is applied between the electrodes, allowing for differential conductance analysis of various graphene layers. Another notable patent is related to an "Electron Microscope, Methods to Determine the Contact Point and the Contact of the Probe." This invention describes an electron microscope designed to observe semiconductive or conductive samples, enabling precise determination of contact points between the probe and the sample surface.

Career Highlights

Wen-Bin Jian has worked with esteemed organizations such as the Metal Industries Research & Development Centre and National Central University. His experience in these institutions has allowed him to develop and refine his innovative ideas in graphene technology.

Collaborations

Wen-Bin Jian has collaborated with notable colleagues, including Tai-Hsin Hsu and Cheng-Hsun Nien. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Wen-Bin Jian is a key figure in the field of graphene technology, with a focus on innovative methods for screening and separation. His contributions through patents and collaborations highlight his commitment to advancing scientific knowledge and technology.