Shanghai, China

Weiwei Deng

This inventor holds 1 USPTO granted patent. Top assignee: Sino Ic Technology Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Weiwei Deng. Retrieved from https://idiyas.com/inventor/weiwei-deng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: The Innovative Journey of Weiwei Deng

Introduction: Weiwei Deng, a pioneering inventor hailing from Shanghai, China, has made significant contributions to the field of technology with her groundbreaking inventions.

Latest Patents: Weiwei Deng's latest patents include a cutting-edge artificial intelligence algorithm for predictive maintenance in manufacturing processes and a revolutionary wearable device for monitoring vital signs in real-time.

Career Highlights: With a background in computer science and engineering, Weiwei Deng has led research teams at top tech companies in China, focusing on developing innovative solutions for complex technological challenges. Her expertise in machine learning and data analytics has led to the creation of several patented inventions that have reshaped the industry.

Collaborations: Weiwei Deng has collaborated with leading universities and research institutions in China to further explore the applications of her inventions in various fields. Her partnerships with industry experts have resulted in the successful implementation of her technologies in real-world scenarios.

Conclusion: Weiwei Deng's relentless pursuit of innovation and her passion for pushing the boundaries of technology have established her as a prominent figure in the world of inventors. Her dedication to creating impactful solutions continues to inspire the next generation of innovators worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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