The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2021
Filed:
Jun. 14, 2019
Sino Ic Technology Co., Ltd., Shanghai, CN;
Hua Wang, Shanghai, CN;
Zhiyong Zhang, Shanghai, CN;
Weiwei Deng, Shanghai, CN;
Kun Yu, Shanghai, CN;
Haiying Ji, Shanghai, CN;
Bin Luo, Shanghai, CN;
Sino IC Technology Co., Ltd., Shanghai, CN;
Abstract
The present invention discloses a halo test method for an optical chip in an integrated circuit. A captured image array is processed as a circle by: dividing the array into circular patterns on the basis of the radius, reconstructing the circular patterns into a two-dimensional array according to coordinates, and then performing corresponding operations on the obtained array to obtain a desired value. By the halo test method for an optical chip in an integrated circuit provided in the present invention, without increasing any extra hardware cost and under the primary test conditions, the technical problem in the prior art that there is no well-developed method and algorithm for testing halo on a fingerprint on display (FOD) chip is solved.