Zhejiang, China

Weimin Lou

This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2023.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Weimin Lou: Innovator in Real-Time Defect Measurement

Introduction

Weimin Lou is a distinguished inventor based in Zhejiang, China. He has made significant contributions to the field of defect measurement through innovative methodologies. His work focuses on enhancing the accuracy of real-time measurements in complex systems.

Latest Patents

Weimin Lou holds a patent for a "Real-time traceability method of width of defect based on divide-and-conquer." This invention addresses the challenges of accurately measuring the width of defects that are close to the diffraction limit of the system. By utilizing a calibration transfer function and multidimensional eigenvector analysis technology, his method allows for real-time traceability of defect widths. The invention employs an extreme random tree regression model trained on data from electromagnetic field simulations, significantly improving the precision of defect detection.

Career Highlights

Weimin Lou is affiliated with Zhejiang University, where he continues to advance research in his field. His innovative approaches have garnered attention and recognition within the academic and industrial communities. His work not only contributes to theoretical advancements but also has practical implications in various applications.

Collaborations

Weimin Lou collaborates with notable colleagues, including Yongying Yang and Fanyi Wang. Their combined expertise fosters a dynamic research environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Weimin Lou's contributions to real-time defect measurement exemplify the impact of innovative thinking in engineering and technology. His patent reflects a significant advancement in the field, addressing critical challenges in defect detection. Through his work at Zhejiang University, he continues to inspire future innovations.

Profile summary based on public USPTO records.
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