Shanghai, China

Weidong Fan

This inventor holds 2 USPTO granted patents. Top assignee: Montage Technology Co., Ltd.. Active years: 2020-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Weidong Fan. Retrieved from https://idiyas.com/inventor/weidong-fan-1fh52ul2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.7

ph-index = 1


Company Filing History:


Years Active: 2020-2025

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2 patents (USPTO):Explore Patents

Title: Weidong Fan: Innovator in Test Circuit Technology

Introduction

Weidong Fan is a notable inventor based in Shanghai, China. He has made significant contributions to the field of test circuit technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of automatic test equipment.

Latest Patents

Weidong Fan's latest patents include a "Test circuit and test apparatus comprising the test circuit." This invention features a signal processor, resistors, and switches that work together to improve the testing process of devices. Another significant patent is the "Method for calibrating channel delay skew of automatic test equipment." This method involves using calibration reference devices to ensure precise measurements and calibrations in testing environments.

Career Highlights

Weidong Fan is currently employed at Montage Technology Co., Ltd. His role at the company allows him to apply his innovative ideas and contribute to advancements in test circuit technology. His expertise has positioned him as a valuable asset in the field.

Collaborations

Weidong has collaborated with notable coworkers, including Dongming Lou and Meng Mei. Their combined efforts have fostered a creative environment that encourages innovation and development in their projects.

Conclusion

Weidong Fan's contributions to test circuit technology exemplify his dedication to innovation. His patents reflect a commitment to improving testing processes, making him a significant figure in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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