Montage Technology Co., Ltd.

Weidong Fan

Yong Wang

Dongming Lou

Ronghui Chen

Meng Mei

The present invention relates to a method for calibrating a channel delay skew of automatic test equipment (ATE), the method comprising: providing multiple calibration reference devices, wherein the calibration reference devices have a second plurality of delay paths each having a predetermined path delay value and coupling a pair of pins of one of the calibration reference devices together, wherein each pin is coupled to at most one delay path; coupling each of the calibration reference devices with the ATE, respectively, wherein the test probe of each of the first plurality of test channels is coupled with a pin of one of the calibration reference devices; testing the calibration reference devices to obtain multiple delay measurements from one or more transmitting channels of the first plurality of test channels to one or more receiving channels of the first plurality of test channels using the ATE; and calculating based on the delay measurements.

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Shanghai, China

Weidong Fan