Austin, TX, United States of America

Wei You

This inventor holds 1 USPTO granted patent. Top assignee: Ansys, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei You. Retrieved from https://idiyas.com/inventor/wei-you-h5eqkizb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wei You - Innovator in Adaptive Mesh Refinement Techniques

Introduction

Wei You is a notable inventor based in Austin, TX, specializing in advanced computational methods for three-dimensional integrated circuits. His innovative work has led to the development of a patent that enhances the efficiency of simulations in stacked models.

Latest Patents

Wei You holds a patent for "Adaptive mesh refinement techniques for three-dimensional stacked models." This computer-implemented method involves generating a first mesh for a layer of a stacked model, performing simulations, and refining the mesh based on interpolated and simulated values. The process significantly improves the accuracy and efficiency of modeling complex 3D integrated circuits.

Career Highlights

Wei You is currently employed at Ansys, Inc., a leading company in engineering simulation software. His expertise in adaptive mesh refinement has contributed to advancements in the field of computational modeling, making significant impacts on the design and analysis of integrated circuits.

Collaborations

Wei collaborates with Xiaokai Zhou, a fellow innovator, to further enhance their research and development efforts in the field of simulation technologies.

Conclusion

Wei You's contributions to adaptive mesh refinement techniques exemplify the importance of innovation in engineering and technology. His work continues to influence the development of more efficient simulation methods in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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