Wei Ye

Title: Innovations of Wei Ye in Electron-Optical Systems

Introduction

Wei Ye is a notable inventor based in Milpitas, California, recognized for his contributions to the field of electron-optical systems. With a total of two patents to his name, he has made significant advancements in the technology used for inspecting and reviewing samples.

Latest Patents

Wei Ye's latest patents focus on a method and system for edge-of-wafer inspection and review. This innovative electron-optical system is designed to inspect or review the edge portion of a sample. It includes an electron beam source that generates one or more electron beams, a sample stage to secure the sample, and an electron-optical column with a set of elements that direct the electron beams onto the sample's edge. Additionally, the system features a sample position reference device and a guard ring device that compensates for fringe fields, with adjustable characteristics. A detector assembly is also included to detect electrons emanating from the sample's surface.

Career Highlights

Wei Ye is currently employed at Kla Tencor Corporation, where he continues to develop and refine his innovative technologies. His work has contributed to advancements in the field of semiconductor inspection and quality control.

Collaborations

Wei Ye collaborates with talented individuals such as Xinrong Jiang and Christopher Sears, enhancing the innovative capabilities of his projects.

Conclusion

Wei Ye's contributions to electron-optical systems demonstrate his commitment to innovation and excellence in technology. His patents reflect a deep understanding of the complexities involved in sample inspection, paving the way for future advancements in the field.