Hsinchu, Taiwan

Wei-Ting Tu

This inventor holds 1 USPTO granted patent. Top assignees: Springsoft USA, Inc., Springsoft, Inc.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei-Ting Tu. Retrieved from https://idiyas.com/inventor/wei-ting-tu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2013

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Wei-Ting Tu and Verification-Environment Quality

Introduction

Wei-Ting Tu is an inventor associated with Hsinchu, Taiwan. His patent work addresses methods for assessing the quality and effectiveness of checkers in a verification environment.

Latest Patents

Tu is associated with 1 patent, titled “Methods and Systems for Evaluating Checker Quality of a Verification Environment.” The invention describes calculating an overall sensitivity for a verification environment and an individual sensitivity for a specific checker. Overall sensitivity estimates the probability that the environment will detect problematic design behaviors propagated to its checker system. Individual sensitivity estimates whether a checker can detect problematic behaviors propagated to a particular design probe. These measures can help assess the robustness of a checker system and identify which checkers may need improvement.

Career Highlights

Tu’s listed company affiliations include Springsoft USA, Inc. and Springsoft, Inc. His patent reflects work on evaluating verification systems and improving the assessment of their checkers.

Collaborations

Tu’s listed coworkers include Kuo-Ching Lin and Michael Lyons.

Conclusion

Wei-Ting Tu’s patent focuses on measuring checker sensitivity to help evaluate verification-environment quality and guide improvements to individual checkers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…