The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2013
Filed:
Dec. 23, 2010
Kai Yang, San Jose, CA (US);
Michael Lyons, Voreppe, FR;
Kuo-ching Lin, Taichung, TW;
Wei-ting Tu, Hsinchu, TW;
Chih-wen Chang, Sanchong, TW;
Tein-chun Wei, Banqiao, TW;
Kai Yang, San Jose, CA (US);
Michael Lyons, Voreppe, FR;
Kuo-Ching Lin, Taichung, TW;
Wei-Ting Tu, Hsinchu, TW;
Chih-Wen Chang, Sanchong, TW;
Tein-Chun Wei, Banqiao, TW;
Springsoft Inc., Hsinchu, TW;
Springsoft USA, Inc., San Jose, CA (US);
Abstract
Methods and systems for evaluating checker quality of a verification environment are provided. In some embodiments, an overall sensitivity for the verification environment and an individual sensitivity for a respective checker are calculated. The overall sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to a checker system including at least one checker, can be detected by the verification environment. The individual sensitivity is a probability that a plurality of problematic design behaviors, which are propagated to at least one specific probe among a plurality of probes of a design, can be detected by the checker corresponding to the specific probe. The overall checker sensitivity numbers can show the robustness of the check system. The individual checker sensitivity can guide the user which individual checker or checkers to improve.