Wei-Jhe Tzai

Title: Innovations of Wei-Jhe Tzai in Measurement Technology.

Introduction

Wei-Jhe Tzai is a notable inventor based in Pingtung County, Taiwan. He has made significant contributions to the field of measurement technology, particularly in the area of overlay mark measurement. His innovative approach has led to the development of a unique measurement method that enhances accuracy in semiconductor manufacturing.

Latest Patents

Wei-Jhe Tzai holds a patent for a "Measurement method of overlay mark." This patent describes a method where an overlay mark on a wafer is measured using various wavelength regions of an optical measurement tool. By obtaining multiple overlay values corresponding to these wavelength regions, the method allows for a more precise determination of the correct wavelength region for the overlay mark. The process also includes measuring the overlay mark with an electrical measurement tool to establish a reference overlay value.

Career Highlights

Wei-Jhe Tzai is currently employed at United Microelectronics Corporation, a leading semiconductor foundry. His work at this company has allowed him to apply his innovative measurement techniques in a practical setting, contributing to advancements in the semiconductor industry.

Collaborations

Wei-Jhe Tzai has collaborated with several talented individuals in his field, including Kuei-Chun Hung and Chun-Chi Yu. These collaborations have fostered a creative environment that encourages the development of new ideas and technologies.

Conclusion

Wei-Jhe Tzai's contributions to measurement technology, particularly through his patented methods, demonstrate his commitment to innovation in the semiconductor industry. His work continues to influence the field and improve measurement accuracy in manufacturing processes.