Wei-Hua Lee

Title: Innovations by Wei-Hua Lee in Image Sensor Testing

Introduction

Wei-Hua Lee is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of image sensor technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of testing image sensor chips.

Latest Patents

Wei-Hua Lee's latest patents include the "Fabrication of wafer-level test module for testing image sensor chips." This invention describes a wafer-level test module that consists of a base layer with multiple first apertures, a cover layer with second apertures, and an optical layer containing multiple optical lenses. The design allows for simultaneous testing of multiple image sensor chips by projecting effective test light onto the image capturing devices. This innovation aims to achieve accurate and rapid testing of image sensor chips in integrated circuit wafers.

Another patent by Wei-Hua Lee is the "Wafer-level test module for testing image sensor chips, the related test method and fabrication." This patent shares similar features with the previous one, emphasizing the alignment of the wafer-level test module with the integrated circuit wafer. The effective test light can be projected onto the image capturing devices, ensuring efficient testing of multiple chips.

Career Highlights

Wei-Hua Lee is currently employed at Visera Technologies Company Limited, where he continues to develop innovative solutions in the field of image sensors. His expertise and dedication to advancing technology have made him a valuable asset to his company.

Collaborations

Wei-Hua Lee collaborates with Sheng-Feng Lu, contributing to the development of cutting-edge technologies in their field.

Conclusion

Wei-Hua Lee's contributions to image sensor testing through his innovative patents demonstrate his commitment to advancing technology. His work at Visera Technologies Company Limited continues to impact the industry positively.