Aalborg, Denmark

Wei Fan

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Intel Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wei Fan. Retrieved from https://idiyas.com/inventor/wei-fan-htq023d1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 10.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Wei Fan: Innovator in Throughput Characterization

Introduction

Wei Fan is a notable inventor based in Aalborg, Denmark. He has made significant contributions to the field of telecommunications, particularly in the area of throughput characterization for user equipment.

Latest Patents

Wei Fan holds 1 patent related to throughput characterization. His patent describes various apparatuses, methods, and storage media for characterizing the throughput of user equipment (UE) during transmission using a modulation and coding scheme (MCS). The innovation focuses on characterizing UE throughput through interpolation for one or more discrete signal strength values.

Career Highlights

Throughout his career, Wei Fan has worked with prominent companies, including Intel Corporation and Intel IP Corporation. His experience in these organizations has allowed him to develop and refine his expertise in telecommunications and related technologies.

Collaborations

Wei Fan has collaborated with notable professionals in his field, including Jagjit Singh Ashta and Anatoliy Sergey Ioffe. These collaborations have contributed to his innovative work and advancements in throughput characterization.

Conclusion

Wei Fan's contributions to throughput characterization demonstrate his commitment to advancing telecommunications technology. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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