Wei-Chung Chang

Title: Innovations of Wei-Chung Chang

Introduction

Wei-Chung Chang is a notable inventor based in Huwei Chen, Taiwan. He has made significant contributions to the field of automatic scanning and marking technology. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of surface morphology detection.

Latest Patents

Wei-Chung Chang holds a patent for an "Automatic Scan and Mark Apparatus." This apparatus features a machine tool, a location detection module, a laser detector, an ink jet, and a control computer. The machine tool includes a movable module and a stage that securely holds a specimen with a scraped surface. The control computer is responsible for determining the position of the movable module, detecting the surface morphology of the scraped surface, and activating the ink jet to mark high points with colored ink. This innovation allows manufacturers to easily identify and redo scraping on determined high points without the need for burdensome measurements.

Career Highlights

Wei-Chung Chang is affiliated with National Formosa University, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in manufacturing and quality control processes.

Collaborations

Some of his notable coworkers include Ming-Chi Chiang and Wen-Yuh Jywe, who contribute to the collaborative environment at National Formosa University.

Conclusion

Wei-Chung Chang's contributions to the field of automatic scanning and marking technology exemplify the impact of innovative thinking in engineering. His patent reflects a significant advancement that benefits manufacturers and enhances operational efficiency.