The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2012
Filed:
Aug. 26, 2009
Wen-yuh Jywe, Huwei Chen, TW;
Chien-hung Liu, Huwei Chen, TW;
Hung-shu Wang, Huwei Chen, TW;
Bo-wei Chen, Huwei Chen, TW;
Jyun-jia Yang, Huwei Chen, TW;
Wei-cheng Tsai, Huwei Chen, TW;
Wei-chung Chang, Huwei Chen, TW;
Ming-chi Chiang, Huwei Chen, TW;
Jia-hong Chen, Huwei Chen, TW;
Wen-Yuh Jywe, Huwei Chen, TW;
Chien-Hung Liu, Huwei Chen, TW;
Hung-Shu Wang, Huwei Chen, TW;
Bo-Wei Chen, Huwei Chen, TW;
Jyun-Jia Yang, Huwei Chen, TW;
Wei-Cheng Tsai, Huwei Chen, TW;
Wei-Chung Chang, Huwei Chen, TW;
Ming-Chi Chiang, Huwei Chen, TW;
Jia-Hong Chen, Huwei Chen, TW;
National Formosa University, Yunlin Hsien, TW;
Abstract
An automatic scan and mark apparatus has a machine tool, a location detection module, a laser detector, an ink jet and a control computer. The machine tool has a movable module and a stage. The stage mounts and holds a specimen having a scraped surface. The control computer controls the location detection module to determine a position of the movable module, controls the laser detector to detect a surface morphology of the scraped surface in a measurement range, and activates the ink jet to eject inks on high points of the scraped surface of the specimen. Thus, the surface morphology is built automatically and high points are screened out and marked by colored ink. Manufacturer may easily redo scraping of determined high points based on the marked location on the specimen without burdensome measurement.