This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: National Formosa University. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Innovations of Ming-Chi Chiang
Introduction
Ming-Chi Chiang is a notable inventor based in Huwei Chen, Taiwan. He has made significant contributions to the field of automatic scanning and marking technology. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of surface morphology detection.
Latest Patents
Ming-Chi Chiang holds a patent for an "Automatic Scan and Mark Apparatus." This invention features a machine tool, a location detection module, a laser detector, an ink jet, and a control computer. The machine tool includes a movable module and a stage that securely holds a specimen with a scraped surface. The control computer is responsible for determining the position of the movable module, detecting the surface morphology of the scraped surface, and activating the ink jet to mark high points with colored ink. This innovative system allows manufacturers to easily identify and redo scraping on determined high points without the need for burdensome measurements.
Career Highlights
Ming-Chi Chiang is affiliated with National Formosa University, where he continues to contribute to research and development in his field. His work has garnered attention for its practical applications in manufacturing and quality control processes.
Collaborations
Ming-Chi Chiang collaborates with esteemed colleagues such as Jyun-Jia Yang and Wei-Chung Chang. Their combined expertise fosters an environment of innovation and advancement in technology.
Conclusion
Ming-Chi Chiang's contributions to the field of automatic scanning and marking technology exemplify the spirit of innovation. His patent and ongoing work at National Formosa University highlight the importance of advancements in manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile