This inventor holds 1 USPTO granted patent. Top assignee: National Formosa University. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Innovations of Jia-Hong Chen in Automatic Scanning Technology
Introduction
Jia-Hong Chen is a notable inventor based in Huwei Chen, Taiwan. He has made significant contributions to the field of automatic scanning technology. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of surface morphology detection.
Latest Patents
Jia-Hong Chen holds a patent for an "Automatic Scan and Mark Apparatus." This invention features a machine tool, a location detection module, a laser detector, an ink jet, and a control computer. The machine tool includes a movable module and a stage that securely holds a specimen with a scraped surface. The control computer plays a crucial role by determining the position of the movable module, detecting the surface morphology of the scraped surface, and activating the ink jet to mark high points with colored ink. This innovative process allows manufacturers to easily identify and redo scraping on determined high points without the need for burdensome measurements.
Career Highlights
Jia-Hong Chen is affiliated with National Formosa University, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in manufacturing and quality control.
Collaborations
Jia-Hong Chen collaborates with esteemed colleagues such as Wen-Yuh Jywe and Chien-Hung Liu. Their combined expertise contributes to the advancement of technology in their respective fields.
Conclusion
Jia-Hong Chen's contributions to automatic scanning technology exemplify the impact of innovative thinking in engineering. His patent for the automatic scan and mark apparatus showcases his commitment to improving manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile