Company Filing History:
Years Active: 2023-2025
Title: Innovations by Wei Chean Tan
Introduction
Wei Chean Tan is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology. With a total of 6 patents to his name, Tan continues to push the boundaries of innovation in his field.
Latest Patents
One of his latest patents is the "Charged particle beam apparatus and focus adjusting method therefor." This invention proposes a technique that enables automatic focus adjustment even for samples with regions of varying heights. The apparatus includes a sample holder, a sample stage, a charged particle gun, and a charged particle beam column designed to irradiate the sample. It also features an objective lens that adjusts focus by changing the intensity of the focusing effect on the charged particle beam. Additionally, a detector captures electrons from the sample to form an electron image, while an optical imaging device captures an optical image of the sample. A control device calculates height information based on the optical image and automatically sets the focus adjustment value for the observation site.
Another notable patent is the "Sample image display system and charged particle beam apparatus." This system displays multiple images of a sample on a screen, along with corresponding symbols for each image. Each symbol is presented in a different mode based on information related to the corresponding image.
Career Highlights
Wei Chean Tan is currently employed at Hitachi High-Tech Corporation, where he continues to develop innovative technologies. His work has significantly impacted the field of charged particle beam applications, enhancing the capabilities of imaging and analysis.
Collaborations
Tan has collaborated with notable colleagues, including Hiroyuki Chiba and Ryo Komatsuzaki, contributing to various projects and advancements in their field.
Conclusion
Wei Chean Tan's contributions to charged particle beam technology exemplify his innovative spirit and dedication to advancing scientific research. His patents reflect a commitment to improving imaging techniques and enhancing the capabilities of charged particle beam applications.