This inventor holds 3 USPTO granted patents, plus 1 CIPO patent. Top assignee: Jentek Sensors, Incorporated. Active years: 2000-2004.
Company Filing History:
Years Active: 2000-2004
Title: Wayne D. Ryan: Innovator in Dielectric Testing Technologies
Introduction
Wayne D. Ryan is a notable inventor based in Pembroke, MA (US), recognized for his contributions to dielectric testing technologies. With a total of 3 patents, Ryan has made significant advancements in methods for inspecting dielectric materials.
Latest Patents
One of his latest patents is an inspection method using penetrant and dielectrometer. This innovative method detects defects in dielectric test materials by utilizing a penetrant material and a dielectric sensor. The penetrant material enhances the dielectric contrast between defects and the test material, allowing for more accurate inspections. The penetrant can be either a liquid, such as water, or a powder, provided it has a substantially different complex permittivity than the test material.
Another significant patent is the segmented field dielectrometer. This device features a sensor face equipped with an excitation electrode that operates with varying voltage. It includes at least two sensing electrodes and a guard electrode, which surrounds the sensing electrodes and maintains a similar voltage. This design allows for single or multiple penetration depth measurements into a test material, enhancing the accuracy of dielectric testing.
Career Highlights
Wayne D. Ryan is currently associated with Jentek Sensors, Incorporated, where he continues to develop innovative solutions in the field of dielectric testing. His work has contributed to advancements in inspection methods that are crucial for ensuring the integrity of dielectric materials.
Collaborations
Ryan has collaborated with notable colleagues, including Darrell E. Schlicker and Neil J. Goldfine, who have also contributed to the field of dielectric testing technologies.
Conclusion
Wayne D. Ryan's innovative work in dielectric testing has led to significant advancements in inspection methods and devices. His contributions continue to impact the field positively, showcasing the importance of innovation in technology.