This inventor holds 1 USPTO granted patent. Top assignee: Schering Aktiengesellschaft. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: Waldfried J Plieth: Innovator in Metallization Inspection
Introduction
Waldfried J Plieth is a notable inventor based in Berlin, Germany. He has made significant contributions to the field of metallization processes, particularly in the inspection and control of these processes. His innovative approach has led to the development of a unique method that enhances the quality and efficiency of metallization.
Latest Patents
Waldfried J Plieth holds a patent for a "Method of and device for inspecting and/or controlling metallization." This patent describes a method for checking and controlling a metallization process in galvanizing or chemical applications. The method is based on measuring light that is scattered off or reflected from the surface being metallized. A deviation from a predetermined nominal value of the scattered or reflected light intensity is used to control at least one process parameter, thereby neutralizing the deviation.
Career Highlights
Plieth has had a distinguished career, working with Schering Aktiengesellschaft, a prominent company in the pharmaceutical and chemical sectors. His work has focused on improving metallization processes, which are critical in various industrial applications.
Collaborations
Throughout his career, Waldfried J Plieth has collaborated with notable colleagues, including Heinrich Meyer and Martin Kurpjoweit. These collaborations have contributed to advancements in the field and have fostered innovation in metallization techniques.
Conclusion
Waldfried J Plieth's contributions to the field of metallization inspection highlight his role as an innovator. His patented method not only improves the quality of metallization processes but also showcases the importance of precision in industrial applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile