The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 1990
Filed:
Nov. 02, 1988
Applicant:
Inventors:
Assignee:
Schering Aktiengesellschaft, Berlin and Bergkamen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
250372 ; 204 141 ; 250341 ; 427 10 ;
Abstract
A method for checking and/or controlling a metallization process in a galvanizing or chemical is based on the measurement of light scattered off or reflected from a surface portion being metallized. A deviation from a predetermined nominal value of the scattered or reflected light intensity serves for controlling at least one process parameter to neutralize the deviation.
Meyer, Heinrich. (1990). Method of and device for inspecting and/or controlling metallization (U.S. Patent No. 4939370). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4939370
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile