Volker Knorz

Title: Volker Knorz: Innovator in Optical Examination Technologies

Introduction

Volker Knorz is a distinguished inventor based in Huettenberg, Germany. He has made significant contributions to the field of optical examination technologies, particularly in the analysis of structured surfaces of objects. His innovative approach has led to the development of a unique method and device that enhances the precision of optical examinations.

Latest Patents

Volker Knorz holds a patent for a "Method and device for optically examining structured surfaces of objects." This invention describes a method and apparatus designed for the optical examination of structured surfaces, especially wafers and masks. The optical apparatus features an observation beam path directed vertically against the object's surface, along with illumination beams that fall both vertically and obliquely onto the surface. The system includes a filter device and detector device within the observation beam path, allowing for detailed analysis. The illumination device is capable of producing simultaneous dark field illumination, enhancing the examination process.

Career Highlights

Volker Knorz is associated with Leica Microsystems Semiconductor GmbH, where he applies his expertise in optical technologies. His work has been pivotal in advancing the capabilities of optical examination systems, making them more efficient and effective for various applications in the semiconductor industry.

Collaborations

Throughout his career, Volker has collaborated with notable colleagues, including Michael Veith and Edgar Maehringer-Kunz. These partnerships have fostered innovation and contributed to the development of cutting-edge technologies in the field.

Conclusion

Volker Knorz's contributions to optical examination technologies exemplify his commitment to innovation and excellence. His patented methods and devices continue to influence the industry, showcasing the importance of precise optical analysis in modern applications.