Volker Hoefer is a distinguished inventor based in Traunreut, Germany. He has made significant contributions to the field of measurement technology, holding a total of 7 patents. His innovative designs focus on enhancing the accuracy and efficiency of position and angle measurement devices.

Latest Patents

Hoefer's latest patents include a position-measuring device and an angle-measuring device. The position-measuring device features a scale and a scanning unit that moves relative to it. This device incorporates a measuring graduation, a reference mark, and area markings that exert different deflection effects on a scanning beam. An area signal detector is designed to detect a fringe pattern during optical scanning, allowing for the generation of distinguishable scanning signals based on the position of the scanning unit.

The angle-measuring device consists of two component groups that can rotate relative to each other. It includes a housing with a connecting device and a scanning unit in the first component group, while the second group features a shaft with a code disk. This device is engineered to apply negative pressure to remove contaminants, ensuring optimal performance.

Career Highlights

Volker Hoefer is currently employed at Dr. Johannes Heidenhain GmbH, a company renowned for its precision measurement technology. His work has significantly advanced the capabilities of measurement devices, making them more reliable and efficient.

Collaborations

Hoefer has collaborated with notable colleagues such as Gerhard Scheglmann and Juergen Schoser. Their combined expertise has contributed to the development of innovative measurement solutions.

Conclusion

Volker Hoefer's contributions to position and angle measurement technologies have established him as a key figure in the field. His patents reflect a commitment to innovation and excellence in measurement solutions.

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