The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2007
Filed:
Feb. 16, 2006
Walter Huber, Traunstein, DE;
Volker Hoefer, Traunreut, DE;
Walter Huber, Traunstein, DE;
Volker Hoefer, Traunreut, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A scanning unit for a position measuring device for scanning a measuring graduation thereof, includes a scanning structure provided on a carrier and formed such that, by interaction of electromagnetic radiation, with the measuring graduation and the scanning structure, a periodic stripe pattern is generated. A detector arrangement includes detector elements of different phases that generate output signals having a phase shift. The detector elements form a periodic pattern, and each detector element is assigned exactly one region of the scanning structure referred to as a bar. The detector elements are combined to form two detector groups. Detector elements of the same phase belong to the same detector group, and the detector elements within one detector group are interconnected. The bars of each detector group cover an active area of equal size. The area center of gravity of the area covered by the bars of the detector groups coincide.