This inventor holds 1 USPTO granted patent. Top assignee: Holotech A.s.. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Innovations of Vladimir Petrovich Loginov
Introduction
Vladimir Petrovich Loginov is a notable inventor based in Kyiv, Ukraine. He has made significant contributions to the field of non-destructive testing through his innovative methods and devices. His work focuses on the optical holographic interferometry technique, which has applications in various industries.
Latest Patents
Loginov holds a patent for a method and device for real-time non-destructive determination of residual stresses in objects. This invention is particularly relevant for testing details, machine units, and mechanisms made from various materials. The patented method involves registering a hologram of the investigation area in its initial state, exposing the surface of the object to a high-current electric pulse, and then creating an interferogram to determine the residual stresses based on the shape and size of the fringes.
Career Highlights
Throughout his career, Loginov has demonstrated a commitment to advancing non-destructive testing techniques. His innovative approach has led to the development of a unique method that enhances the accuracy and efficiency of stress determination in materials. He is associated with Holotech A.S., where he continues to work on groundbreaking technologies.
Collaborations
Loginov has collaborated with notable individuals in his field, including John Petter Fjeldstad and Irina Evgenievna Fjeldstad. These collaborations have contributed to the advancement of his research and the successful implementation of his inventions.
Conclusion
Vladimir Petrovich Loginov's contributions to the field of non-destructive testing through his innovative patent highlight his expertise and dedication. His work continues to influence the industry and pave the way for future advancements in material testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile