The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 30, 2003
Filed:
Jun. 05, 2000
John Petter Fjeldstad, Sandefjord, NO;
Irina Evgenievna Fjeldstad, Sandefjord, NO;
Leonid Mikhailovich Lobanov, Kiev, UA;
Vjacheslav Avtonomovich Pivtorak, Kiev, UA;
Nikolay Georgievich Kuvshinsky, Kiev, UA;
Sergey Gavrilovich Andrushchenko, Kiev, UA;
Vladimir Petrovich Kushniruk, Kiev, UA;
Valeriy Aleksandrovich Pavlov, Kiev, UA;
Vladimir Petrovich Loginov, Kiev, UA;
Peter Dmitrievich Krotenko, Kiev, UA;
HoloTech a.s., Sandefjord, NO;
Abstract
This invention relates to a method and device for non-destructive testing of details, machine units and mechanisms, various materials, and in particular, to a method and device for non-destructive determination of residual stresses which are based on the optical holographic interferometry technique. First, a hologram of the investigation area of the object in its initial state is registered. Then the release of the residual stresses in an investigation point in the investigation area is performed by exposing the surface of the object to a high-current electric pulse with rectangular shape. Finally, an interferogram of the exact same area of the object is made, and the residual stresses at the investigation area are determined from the shape and size of the fringes in the interferogram.