This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996
Title: Celebrating the Innovations of Virginia H. Brecher
Introduction: Virginia H. Brecher is a notable inventor based in West Cornwall, Connecticut, whose contributions to technology have left a significant impact in the field of automated defect detection. With one patented invention, her work exemplifies the intersection of creativity and engineering in enhancing manufacturing processes.
Latest Patents: Virginia H. Brecher holds a patent for an "Automated Defect Classification System," which is an integrated visual defect detection and classification system. This invention comprises adaptive defect detection and image labeling, defect feature measures, and a knowledge-based inference shell/engine that utilizes fuzzy logic for classification. The system is designed to detect and analyze product defects across various application domains, including semiconductor and electronic packaging manufacturing.
Career Highlights: Throughout her career, Virginia has been affiliated with the prestigious International Business Machines Corporation (IBM), where her innovative work continues to shape the future of defect classification technologies. Her expertise in creating sophisticated detection systems has positioned her as a valuable asset in the realm of industrial manufacturing.
Collaborations: Virginia has collaborated with esteemed colleagues, including Paul B-L. Chou and Robert W. Hall, who have contributed to her innovative projects. These partnerships reflect her commitment to teamwork and the sharing of knowledge to drive advancements in technology.
Conclusion: Virginia H. Brecher stands as an inspiring figure in the world of inventors, showcasing how a single patent can influence industries and improve processes. Her work in automated defect classification not only highlights her ingenuity but also serves as a testament to the importance of innovation in today's technology-driven landscape.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
