The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 06, 1996
Filed:
Oct. 22, 1993
Virginia H Brecher, West Cornwall, CT (US);
Paul B-L, Chou, Montvale, NJ (US);
Robert W Hall, Jericho, VT (US);
Debra M Parisi, Carmel, NY (US);
Ravishankar Rao, White Plains, NY (US);
Stuart L Riley, Colchester, VT (US);
Martin C Sturzenbecker, Carmel, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An integrated visual defect detection and classification system. The invention includes adaptive defect detection and image labeling, defect feature measures, and a knowledge based inference shell/engine for classification based on fuzzy logic. The combination of these elements comprises a method and system for providing detection and analysis of product defects in many application domains, such as semiconductor and electronic packaging manufacturing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile