Jericho, VT, United States of America

Robert W Hall

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert W Hall. Retrieved from https://idiyas.com/inventor/robert-w-hall-5vcb5bln

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 213(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: The Innovations of Robert W. Hall

Introduction

Robert W. Hall is a notable inventor based in Jericho, Vermont, known for his contributions to automated defect detection systems. His work focuses on enhancing the quality control processes in various manufacturing sectors, particularly in semiconductor and electronic packaging.

Latest Patents

Robert W. Hall holds a patent for an "Automated Defect Classification System." This integrated visual defect detection and classification system incorporates adaptive defect detection and image labeling. It also features defect measurement and a knowledge-based inference engine for classification based on fuzzy logic. This innovative combination provides a method and system for detecting and analyzing product defects across multiple application domains.

Career Highlights

Hall is associated with International Business Machines Corporation (IBM), where he has made significant strides in the field of automated systems. His expertise in defect classification has positioned him as a key player in improving manufacturing processes.

Collaborations

Some of his notable coworkers include Virginia H. Brecher and Paul B-l, Chou, who have collaborated with him on various projects within the realm of automated systems.

Conclusion

Robert W. Hall's contributions to automated defect detection systems exemplify the importance of innovation in manufacturing. His work continues to influence quality control practices across industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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