Knoxville, TN, United States of America

Vineet K Khullar

This inventor holds 1 USPTO granted patent. Top assignee: Tsinghua University. Active years: 2019.


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of Vineet K Khullar

Introduction

Vineet K Khullar is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of chemical mapping through his innovative work. His expertise and dedication to research have led to the development of advanced technologies that enhance material identification.

Latest Patents

Vineet K Khullar holds 1 patent for his invention titled "Surface Plasmon Scanning-Tunneling Chemical Mapping (SPSTM) System." This system is designed to determine identification characteristics of a target material. It utilizes an optical beam source that launches an optical beam through a transparent optical element to excite surface plasmons in the material layer. An optical probe with a nanometer-sized tip measures a probe signal associated with the surface plasmons that tunnel from the material layer through a nanometer-sized region of the target material. The optical property analyzer then determines at least one optical property associated with this region based on the collected probe signal.

Career Highlights

Vineet K Khullar is affiliated with Tsinghua University, where he continues to push the boundaries of research and innovation. His work has garnered attention for its potential applications in various scientific fields.

Collaborations

Some of his notable coworkers include Gong Gu and Ali Passian, who have collaborated with him on various research projects.

Conclusion

Vineet K Khullar's contributions to the field of chemical mapping through his innovative SPSTM system exemplify the impact of dedicated research and collaboration in advancing technology. His work continues to inspire future innovations in material identification.

Profile summary based on public USPTO records.
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