The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2019
Filed:
May. 09, 2018
Institute for Electronics and Information Technology IN Tianjin Tsinghua University, Zhongxin Tianjin eco, CN;
Thomas L. Ferrell, Knoxville, TN (US);
Gong Gu, Knoxville, TN (US);
Vineet K. Khullar, Knoxville, TN (US);
Ali Passian, Knoxville, TN (US);
Abstract
A Surface Plasmon Scanning-Tunneling Chemical Mapping (SPSTM) system is disclosed that determines identification characteristics of a target material. An optical beam source launches an optical beam that propagates through a transparent optical element to a material layer to excite surface plasmons of the material layer. An optical probe with a nanometer-sized tip is positioned over a nanometer-sized region of the target material, which is positioned on the material layer, to measure a probe signal associated only with the surface plasmons that tunnel from the material layer through the nanometer-sized region of the target material and collected by the optical probe. An optical property analyzer is configured to determine at least one optical property associated with the nanometer-sized region based on the probe signal associated with the surface plasmons collected by the optical probe. The optical properties identify identification characteristics associated with the nanometer-sized region of the target material.