Lisbon, Portugal

Vincent Lecrubier

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Skydio, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vincent Lecrubier. Retrieved from https://idiyas.com/inventor/vincent-lecrubier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Vincent Lecrubier: Inventor in UAV-Based Structure Inspection

Introduction

Vincent Lecrubier is an inventor based in Lisbon, Portugal, whose patent work concerns semantic three-dimensional scanning for inspecting structures with unmanned aerial vehicles (UAVs). He is associated with Skydio, Inc.

Latest Patents

Lecrubier is named on 1 patent: “Multi-phase semantic three-dimensional scan for structure inspection.” The invention describes a two-phase inspection process. In the first phase, a UAV identifies structural components, develops a semantic understanding of them, and determines their poses. Using that information, the system plans a flight path with capture points and camera poses. In the second phase, the UAV follows the planned path to inspect all or selected components.

Career Highlights

The patent reflects work at the intersection of UAV flight planning, three-dimensional scanning, and automated structure inspection. Its multi-phase approach uses information gathered during an initial inspection to guide more targeted image capture in a subsequent phase.

Collaborations

Lecrubier’s listed coworkers include Adam Parker Bry and Hayk Martirosyan. The patent is associated with Skydio, Inc.

Conclusion

Vincent Lecrubier’s patent describes a UAV inspection method that combines semantic understanding, component pose information, and planned camera viewpoints to support structured three-dimensional inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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