Montreal, France

Vincent Detalle

This inventor holds 1 USPTO granted patent. Top assignee: Commissariat a L'energie Atomique Et Aux Energies Alternatives. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vincent Detalle. Retrieved from https://idiyas.com/inventor/vincent-detalle-ouoibecw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2006

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Vincent Detalle: Innovator in Optical Emission Spectrometry

Introduction

Vincent Detalle is a notable inventor based in Montreal, France. He has made significant contributions to the field of optical emission spectrometry, particularly in the analysis of materials. His innovative work focuses on developing devices that enhance the accuracy and efficiency of elemental analysis.

Latest Patents

Vincent Detalle holds a patent for an "Elementary analysis device by optical emission spectrometry on laser produced plasma." This device comprises a pulsed laser source, means for focusing light from this source onto an object to be analyzed to produce plasma on the surface of the object, means of analyzing a plasma radiation spectrum, means of determining the elementary composition of the object from this analysis, and possibly means for displacing the object. The invention is particularly applicable to testing radioactive materials. He has 1 patent to his name.

Career Highlights

Vincent Detalle is associated with the Commissariat à l'Énergie Atomique et aux Énergies Alternatives, where he applies his expertise in developing advanced analytical devices. His work has been instrumental in enhancing the capabilities of elemental analysis in various applications.

Collaborations

Vincent has collaborated with notable colleagues such as Jean-Luc Lacour and Jean-François Wagner, contributing to the advancement of research in his field.

Conclusion

Vincent Detalle's innovative contributions to optical emission spectrometry demonstrate his commitment to advancing technology in material analysis. His work continues to impact the field significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…