This inventor holds 1 USPTO granted patent. Top assignee: Tma Technologies, Inc.. Active years: 1993.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1993
Title: Vincent C. Skurdal: Innovator in Optical Measurement Technology
Introduction
Vincent C. Skurdal is a notable inventor based in Bozeman, MT (US). He has made significant contributions to the field of optical measurement technology, particularly through his innovative patent that enhances the capabilities of scatterometry.
Latest Patents
Vincent holds a patent for a "Modular scatterometer with interchangeable scanning heads." This optical measurement device produces quality light scatter measurements using Bidirectional Reflective Distribution Function (BRDF) techniques. It analyzes data generated from an accurate, portable, and relatively inexpensive scatterometer. The invention features interchangeable scanning heads, each equipped with ROM data storage containing configuration information. This design allows for versatile measurements of light scatter across various applications and environmental conditions, where such measurements were previously unfeasible.
Career Highlights
Vincent is associated with Tma Technologies, Inc., where he applies his expertise in optical measurement technology. His work has contributed to advancements in the field, making significant impacts on how light scatter measurements are conducted.
Collaborations
Vincent has collaborated with notable colleagues, including Marvin L. Bernt and Paul D. Chausse. Their combined efforts have fostered innovation and development in optical measurement technologies.
Conclusion
Vincent C. Skurdal's contributions to optical measurement technology through his innovative patent demonstrate his commitment to advancing the field. His work continues to influence how light scatter measurements are performed, paving the way for new applications and improvements in measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile