Turku, Finland

Ville Laitala



 

Average Co-Inventor Count = 1.2

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2010-2020

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6 patents (USPTO):Explore Patents

Title: Innovations of Ville Laitala

Introduction

Ville Laitala is a notable inventor based in Turku, Finland. He has made significant contributions to the field of optical measurement technology. With a total of six patents to his name, Laitala's work focuses on reducing measurement variation and enhancing detection methods in sample analysis.

Latest Patents

One of Laitala's latest patents involves a measurement device designed to reduce measurement variation in optical measurements of sample materials. This device includes mechanical support elements for both the sample well and the measurement head. It features a control system that conducts at least two optical measurements from different locations within the sample well. The final measurement result is derived from these multiple measurements, following a predetermined rule. Another significant patent is a device for detecting whether a sample well contains a sample. This device utilizes fluorescent substances for optical analysis and computes an indicator value based on the luminescence emission signal. The controller compares this value to a reference to determine the presence of a sample.

Career Highlights

Ville Laitala is currently employed at Wallac Oy, where he continues to innovate in the field of optical measurement. His work has been instrumental in advancing technologies that improve measurement accuracy and sample detection.

Collaborations

Laitala collaborates with esteemed colleagues such as Raimo Harju and Pauli Salmelainen. Their combined expertise contributes to the development of cutting-edge technologies in their field.

Conclusion

Ville Laitala's contributions to optical measurement technology through his patents and collaborations highlight his role as a significant inventor in the industry. His innovative approaches continue to influence advancements in sample analysis and measurement accuracy.

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