Zelenograd, Russia

Viktor Bykov

This inventor holds 1 USPTO granted patent. Top assignee: Nt-Mdt Development Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Viktor Bykov. Retrieved from https://idiyas.com/inventor/viktor-bykov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Viktor Bykov: Innovator in Scanning Probe Technology

Introduction

Viktor Bykov is a prominent inventor based in Moscow-Zelenograd, Russia. He has made significant contributions to the field of scanning probe technology, particularly through his innovative patent that enhances the capabilities of probe-based apparatus.

Latest Patents

Viktor Bykov holds a patent for a "Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non-resonant oscillatory mode." This invention relates to multi-purpose probe-based apparatus and methods for providing images of surface topography, as well as detecting and quantitatively mapping local mechanical and electromagnetic properties. The methods include filtering incoming probe signals, which provide time deflection curves used for controlling scanning and collecting data that reflects sample adhesion, stiffness, elastic modulus, and viscoelastic response, along with electric and magnetic interactions. The invention allows for adaptive choice of an AFM's deflection set-point, enabling imaging at the contact repulsive force for precise surface profilometry. The stable thermal environment reduces apparatus thermal drift and improves performance.

Career Highlights

Viktor Bykov is associated with Nt-mdt Development Inc., where he continues to advance his research and development in scanning probe technology. His work has been instrumental in enhancing the functionality and precision of probe-based measurements.

Collaborations

Viktor has collaborated with notable professionals in his field, including Serguei Magonov and Sergey Belikov. Their combined expertise has contributed to the advancement of technologies in scanning probe microscopy.

Conclusion

Viktor Bykov's innovative work in scanning probe technology exemplifies the impact of dedicated research and development in the field of surface analysis. His contributions continue to influence advancements in the understanding of material properties and interactions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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