Richfield, OH, United States of America

Vikas Prakash

This inventor holds 1 USPTO granted patent. Top assignee: Case Western Reserve University. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Vikas Prakash. Retrieved from https://idiyas.com/inventor/vikas-prakash

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Vikas Prakash: Innovator in Microstructure and Nanostructure Measurement

Introduction

Vikas Prakash is a notable inventor based in Richfield, OH (US). He has made significant contributions to the field of microstructure and nanostructure measurement. His innovative approach has led to the development of a unique method for characterizing the properties of these specimens.

Latest Patents

Vikas Prakash holds 1 patent for his invention titled "Method and system for measuring properties of microstructures and nanostructures." This patent presents a method that includes attaching a specimen to two probes and measuring its properties during displacement. The method allows for the acquisition of parameters associated with the specimen, which can be used to determine its properties effectively.

Career Highlights

Vikas Prakash is affiliated with Case Western Reserve University, where he continues to advance research in his field. His work has garnered attention for its practical applications in various scientific and engineering domains.

Collaborations

He has collaborated with notable colleagues, including Alexis Abramson and Utkarsha Singh, contributing to a dynamic research environment.

Conclusion

Vikas Prakash's innovative methods in measuring microstructures and nanostructures highlight his significant role in advancing technology in this area. His contributions continue to influence research and development in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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