The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Jun. 07, 2007
Alexis Abramson, Cleveland Heights, OH (US);
Vikas Prakash, Richfield, OH (US);
Utkarsha Singh, Cleveland, OH (US);
Alexis Abramson, Cleveland Heights, OH (US);
Vikas Prakash, Richfield, OH (US);
Utkarsha Singh, Cleveland, OH (US);
Case Western Reserve University, Cleveland, OH (US);
Abstract
A method is presented for characterizing properties of a specimen, such as a microstructure and a nanostructure. The method includes attaching a first end of the specimen to a first probe () and attaching a second end of the specimen, which is spaced apart from the first end by an intermediate portion, to a second probe that extends from a transducer (). The method also includes causing a corresponding displacement of the specimen attached between the first probe and the second probe (). At least one parameter associated with the specimen is acquired () during the corresponding displacement based on at least one output signal from the transducer. The properties of the specimen can be determined based on the at least one parameter ().