Cleveland, OH, United States of America

Utkarsha Singh

This inventor holds 1 USPTO granted patent. Top assignee: Case Western Reserve University. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Utkarsha Singh. Retrieved from https://idiyas.com/inventor/utkarsha-singh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Utkarsha Singh: Innovator in Microstructure and Nanostructure Measurement

Introduction

Utkarsha Singh is a notable inventor based in Cleveland, OH (US). He has made significant contributions to the field of material science, particularly in the measurement of microstructures and nanostructures. His innovative approach has the potential to enhance the understanding of material properties at a microscopic level.

Latest Patents

Utkarsha Singh holds a patent for a "Method and system for measuring properties of microstructures and nanostructures." This method involves characterizing properties of a specimen by attaching it to probes and measuring its displacement. The process allows for the acquisition of parameters associated with the specimen, which can then be used to determine its properties. He has 1 patent to his name.

Career Highlights

Utkarsha Singh is affiliated with Case Western Reserve University, where he applies his expertise in research and innovation. His work focuses on advancing techniques for analyzing materials, which is crucial for various applications in engineering and technology.

Collaborations

He has collaborated with esteemed colleagues such as Alexis Abramson and Vikas Prakash. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in research.

Conclusion

Utkarsha Singh's contributions to the field of microstructure and nanostructure measurement exemplify the impact of innovative thinking in science and technology. His work continues to inspire future advancements in material characterization.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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