Colchester, VT, United States of America

Vanessa Brunkhorst


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2006

where 'Filed Patents' based on already Granted Patents

1 patent (USPTO):

Title: Innovator Spotlight: Vanessa Brunkhorst

Introduction

Vanessa Brunkhorst is a notable inventor based in Colchester, Vermont, who has made significant advancements in the field of diagnostic technology. With a patent to her name, she has demonstrated her expertise and innovation as part of her career.

Latest Patents

Vanessa holds a patent titled "Method for optimizing a set of scan diagnostic patterns." This invention focuses on a comprehensive method and system for generating a set of scan diagnostic patterns aimed at diagnosing failures in scan chains. The patent details a systematic approach that includes selecting a set of latches, choosing test patterns, and determining lateral insertions, ultimately refining the diagnostic process for improved efficiency.

Career Highlights

Vanessa Brunkhorst is affiliated with the International Business Machines Corporation (IBM), where she has contributed to the advancement of technology through her innovative methods. Her work not only reflects her technical capabilities but also her commitment to pushing the boundaries of current diagnostic practices.

Collaborations

Throughout her career, Vanessa has worked alongside esteemed colleagues such as Frank O. Distler and L. Owen Farnsworth. Their collective expertise in the field has likely fostered a collaborative environment, enabling the development of cutting-edge solutions and innovations in technology.

Conclusion

Vanessa Brunkhorst exemplifies the spirit of innovation and dedication in her field. With her patent and collaborative efforts at IBM, she continues to impact the technology landscape positively, paving the way for future advancements in diagnostic methodologies.

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