The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2006
Filed:
Nov. 14, 2003
Vanessa Brunkhorst, Colchester, VT (US);
Frank O. Distler, Williston, VT (US);
L. Owen Farnsworth, Iii, Lincoln, VT (US);
Alan R. Humphrey, St. Albans, NY (US);
Kevin W. Stanley, St. Albans, VT (US);
Vanessa Brunkhorst, Colchester, VT (US);
Frank O. Distler, Williston, VT (US);
L. Owen Farnsworth, III, Lincoln, VT (US);
Alan R. Humphrey, St. Albans, NY (US);
Kevin W. Stanley, St. Albans, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for generating a set of scan diagnostic patterns for diagnosing fails in scan chains. The method including: (a) selecting a set of latches; (b) selecting a pattern from a set of test patterns; (c) determining the number of lateral insertions of the selected pattern; (d) determining a number of new lateral insertions that the selected pattern would add to the set of scan diagnostic pattern and adding the selected pattern and a corresponding new insertion count to a count list; (e) repeating steps (b) through (d) until all patterns of the set of test patterns have been selected; (f) selecting a pattern from the count list; (g) adding the pattern selected from the count list to the set of scan diagnostic patterns; and (h) repeating steps (b) through (g) until a there are a predetermined number of patterns in the set of scan diagnostic patterns.