This inventor holds 5 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 2002-2007.
Company Filing History:
Years Active: 2002-2007
Title: The Innovations of Van C Huynh
Introduction
Van C Huynh is a notable inventor based in Richardson, TX (US). He has made significant contributions to the field of memory device testing, holding a total of 5 patents. His work focuses on enhancing the efficiency and functionality of memory devices, particularly in reduced power states.
Latest Patents
One of Huynh's latest patents is a memory device tester and method for testing reduced power states. This innovative device is capable of testing for proper operation of reduced power states in memory devices. The memory device tester can include a processor or a state machine, each configured to send commands to the memory device and to compare results. An example of a memory device that can be tested by this device is a Direct Rambus Dynamic Random Access Memory (DRDRAM). The described processing systems and other circuits can test a DRDRAM for proper operation in a standby (STBY) state. When the DRDRAM is in STBY, the column decoder is shut off to conserve power, and the DRDRAM should not respond to column packets on the column control bus. The method and apparatus provide for testing that the column decoder is shut off when in STBY with no banks active, which is the recommended usage pattern for the part.
Career Highlights
Huynh's career is marked by his dedication to advancing memory technology. His work at Micron Technology Incorporated has positioned him as a key player in the development of innovative testing solutions for memory devices. His patents reflect a deep understanding of the complexities involved in memory operations and power management.
Collaborations
Throughout his career, Huynh has collaborated with talented individuals such as Adin E Hyslop and Matthew Ray Harrington. These collaborations have contributed to the successful development of his patented technologies.
Conclusion
Van C Huynh's contributions to memory device testing are significant and impactful. His innovative approaches to testing reduced power states enhance the efficiency of memory devices, showcasing his expertise in the field. His work continues to influence advancements in memory technology.