Vahe Ghazikhanian

Title: Innovator Spotlight: Vahe Ghazikhanian

Introduction: Vahe Ghazikhanian, located in Glendale, CA, is a notable inventor recognized for his contributions to the field of electromagnetic radiation measurements. With one patent to his name, his innovative approach offers significant advancements in measuring material thickness.

Latest Patents: Ghazikhanian holds a patent for a "Radiation-based thickness gauge." This patent outlines a system and method for measuring the thickness of a material layer by utilizing electromagnetic radiation. The innovative system includes a radiation source that directs the first radiation towards a material layer with a defined thickness. This interaction causes the layer to emit secondary radiation. A strategically positioned filter between the material layer and a radiation detector manages the second radiation to emit third radiation, which the detector then analyzes to measure the material's thickness accurately.

Career Highlights: Ghazikhanian currently works with NDC Technologies Limited, where he leverages his expertise in the field of imaging and measurement technologies. His contributions have added to the company's portfolio of advanced measurement solutions, reinforcing its position in the industry.

Collaborations: While developing his notable innovations, Ghazikhanian collaborates with Ahmad R Shishegar, a coworker who shares a passion for advancing measurement technologies. Their combined efforts contribute to the exploration of new methodologies and applications in the field.

Conclusion: Vahe Ghazikhanian's innovative spirit and dedication to advancing thickness measurement technologies are evident through his patent and professional journey. His work continues to inspire future innovations within the industry, marking him as a distinguished inventor in the realm of electromagnetic radiation applications.