Atsugi, Japan

Uytaka Nakamura

This inventor holds 1 USPTO granted patent. Top assignee: Sokkisha Co., Ltd.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Uytaka Nakamura. Retrieved from https://idiyas.com/inventor/uytaka-nakamura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 53(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Uytaka Nakamura: Innovator in Satellite Technology

Introduction

Uytaka Nakamura is a prominent inventor based in Atsugi, Japan. He has made significant contributions to the field of satellite technology, particularly in the development of antennas for location measuring receivers. His innovative work has garnered attention in the industry and has led to the filing of a patent.

Latest Patents

Uytaka Nakamura holds a patent for an "Antenna for a satellite location measuring receiver." This invention showcases his expertise in enhancing satellite communication and positioning systems. The patent reflects his commitment to advancing technology in this critical area.

Career Highlights

Nakamura is associated with Sokkisha Co., Ltd., a company known for its contributions to precision measurement and surveying equipment. His role at Sokkisha has allowed him to work on cutting-edge projects that push the boundaries of satellite technology.

Collaborations

Uytaka Nakamura collaborates with Shigeyuki Sawaguchi, a fellow innovator in the field. Their partnership exemplifies the spirit of teamwork and innovation that drives advancements in technology.

Conclusion

Uytaka Nakamura's contributions to satellite technology through his patent and work at Sokkisha Co., Ltd. highlight his role as a key inventor in the industry. His innovative spirit continues to inspire advancements in satellite communication systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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