Mettmann, Germany

Uwe Conrads

This inventor holds 1 USPTO granted patent. Top assignees: Thyssen Krupp Ag, Thyssenkrupp Industrial Solutions Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Uwe Conrads. Retrieved from https://idiyas.com/inventor/uwe-conrads

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Uwe Conrads: Inventor of an Aircraft-Based Inspection System

Introduction

Uwe Conrads is an inventor associated with Mettmann, Germany. His patent work includes an aircraft-based system and method for inspecting equipment in coking plants and identifying potential sources of error.

Latest Patents

Conrads is associated with 1 patent, titled “Aircraft and Method for Inspecting Equipment in Coking Plants to Detect Sources of Error.” The invention describes an aircraft equipped with an inspection device that examines equipment surfaces while maintaining distance from them. A transmitting and receiving device supports data communication with other aircraft or an external analysis device. The method converts captured phototechnical and optical data, particularly two-dimensional data, into a three-dimensional thermal point cloud for analysis.

Career Highlights

The provided career information associates Conrads with ThyssenKrupp AG and thyssenkrupp Industrial Solutions AG. His patent focuses on applying aircraft-based inspection and data analysis to equipment in coking plants.

Collaborations

The listed coworkers are Ronald Kim and Sophie Ruoshan Wei. The available information does not specify their roles or the nature of their collaboration with Conrads.

Conclusion

Uwe Conrads’s patent presents an aircraft-based approach to inspecting coking-plant equipment, combining remote surface inspection with data conversion to support the detection of potential errors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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