The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 2026

Filed:

Jan. 18, 2022
Applicants:

Thyssenkrupp Industrial Solutions Ag, Essen, DE;

Thyssenkrupp Ag, Essen, DE;

Inventors:

Ronald Kim, Essen, DE;

Marcel Schulz, Bochum, DE;

Uwe Conrads, Mettmann, DE;

Philipp Esser, Cologne, DE;

Sophie Ruoshan Wei, Munich, DE;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B64U 101/30 (2023.01); C10B 45/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); C10B 45/00 (2013.01); B64U 2101/30 (2023.01); G06T 2207/20182 (2013.01);
Abstract

The present disclosure relates to an aircraft and to a method using this aircraft to inspect equipment in coking plants for detecting sources of error. The aircraft has at least one inspection device for inspecting surfaces of the equipment that are to be inspected, and an airspace, distanced from one of the surfaces to be inspected, and at least one transmitting and receiving device for data communication with at least other aircraft or at least one external analysis device for detecting the sources of error. The method comprises converting the detected phototechnical and optical data, in particular 2D data, into a 3D thermal point cloud by means of a conversion unit of the analysis device.


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