Umihiko Ito

Title: Umihiko Ito: Innovator in Abnormality Detection Technology

Introduction

Umihiko Ito is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of technology, particularly in the area of abnormality detection. His innovative work has led to the development of a unique patent that addresses critical challenges in this domain.

Latest Patents

Umihiko Ito holds a patent for an "Abnormality detection apparatus, abnormality detection method and non-transitory computer readable medium." This invention includes a reception unit for receiving radio waves, a feature amount extraction unit for extracting multiple feature amounts in a predetermined frequency band from the received radio waves, and a recording unit for associating the extracted feature amounts with their frequency bands. Additionally, a processing unit determines whether the acquired feature amounts fall within a preset normal range, generating an abnormality determination mask based on the results. This technology is essential for detecting abnormalities in radio waves.

Career Highlights

Umihiko Ito is currently employed at NEC Corporation, a leading technology company known for its innovative solutions. His work at NEC has allowed him to focus on developing advanced technologies that enhance the detection and analysis of abnormalities in various applications.

Collaborations

Umihiko has collaborated with notable colleagues, including Kenji Kouno and Toshiki Takeuchi. Their combined expertise has contributed to the advancement of technology in the field of abnormality detection.

Conclusion

Umihiko Ito's contributions to the field of abnormality detection technology exemplify his innovative spirit and dedication to advancing technological solutions. His patent and work at NEC Corporation highlight the importance of innovation in addressing complex challenges in today's world.