The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Dec. 21, 2020
Nec Corporation, Tokyo, JP;
Umihiko Ito, Tokyo, JP;
Kenji Kouno, Tokyo, JP;
Toshiki Takeuchi, Tokyo, JP;
Jun Sakai, Tokyo, JP;
Taichi Ohtsuji, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection apparatus according to an example embodiment includes a reception unit for receiving radio waves, a feature amount extraction unit for extracting a plurality of feature amounts in a predetermined frequency band from the received radio waves, a recording unit for recording the plurality of extracted feature amounts and the frequency band in association with each other, and a processing unit for acquiring a plurality of feature amounts in a predetermined range from the plurality of accumulated feature amounts, determining whether or not the acquired feature amounts fall within a preset normal range, and generating, based on a result of the determination, an abnormality determination mask, threshold values for the plurality of feature amounts, in order to detect an abnormality of the radio waves being set in the abnormality determination mask.