Ottendorf-Okrilla, Germany

Ulrike Mueller-Schniek


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2018-2020

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2 patents (USPTO):Explore Patents

Title: Ulrike Mueller-Schniek: Innovator in Semiconductor Testing Technologies

Introduction

Ulrike Mueller-Schniek is a prominent inventor based in Ottendorf-Okrilla, Germany. She has made significant contributions to the field of semiconductor testing technologies, holding 2 patents that enhance the efficiency and flexibility of testing processes.

Latest Patents

One of her latest inventions is a sleek serial interface for a wrapper boundary register, which includes both a device and method. This invention reduces the number of terminals required to control a test mode, test function, and test results for at least one 'wrapped core', which is a core surrounded by a wrapper boundary register. The invention improves test flexibility and speed, suggesting a serial test interface that comprises a state machine and an instruction register for wrapper instructions. These components are supplied through a single physical data input terminal. The state machine reads wrapper instructions held by the instruction register and generates on-chip wrapper control signals according to the given standard for the wrapper boundary register of the core. The single input terminal also supplies an input test signal for coupling to the wrapper boundary register as an on-chip logical input test signal. Additionally, a single output terminal returns an output test signal from the output of the wrapper boundary register. This invention may apply to IEEE 1500 control signals.

Career Highlights

Ulrike has worked with notable companies in the semiconductor industry, including X-Fab Semiconductor Foundries AG and X-Fab Semiconductor Foundries GmbH. Her experience in these organizations has contributed to her expertise in developing innovative testing solutions.

Collaborations

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Conclusion

Ulrike Mueller-Schniek is a trailblazer in the field of semiconductor testing technologies, with her inventions paving the way for more efficient testing processes. Her contributions continue to impact the industry positively.

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